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Forum Discussion
alan27
Oct 29, 2011Aspirant
Disk drive diagnostic tool are they definitive ?
Hi All Can anyone let me know if the disk drive diagnostic tools are definitive. If I run the Western Digital Data LifeGuard Diagnostics tool on my 4 x 2Tb WD-20EARS CAVIAR GREEN 2TB 64MB 7200 SA...
alan27
Oct 31, 2011Aspirant
Ok so out of the 4 x 2Tb WD-20EARS CAVIAR GREEN 2TB , Disk 1 failed. Disk 2, 3, 4 passed . But I’m very worried that the remaining disk are on their way out , as they were all purchased at the same time , maybe a bad batch ? any advice you could give me here would be most appreciated.
Here is the SMART logs for each disk
Disk 1 , this is the one that failed
Disk 2 ,
Disk 3
Disk 4
What I find odd ( to my untrained eye ) is Disk 1 looks ok in the logs , no errors like 2,3,4 but yet that’s the one the failed .... also 2,3,4 are almost identical 12 errors ? hmmm? I have also read about ATA Error Counts , Reallocated Sector Counts and Load Cycle Count as ones to look out for as a guide to if you hard drive is on its way out ....
Is 12 ATA errors bad ? is a Load Cycle Count of disk 2: 362613 Disk 3: 421549 Disk 4: 423058 something I should be worrying about ? these hard drives are only 10 month old .
Any help / advice you can give me here would be most appreciated.
Alan
Here is the SMART logs for each disk
Disk 1 , this is the one that failed
=== START OF INFORMATION SECTION ===
Device Model: WDC WD20EARS-00J2GB0
Firmware Version: 80.00A80
User Capacity: 2,000,398,934,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Oct 27 09:48:32 2011 WEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (40260) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 172 169 021 Pre-fail Always - 8400
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 37
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 091 091 000 Old_age Always - 7198
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 35
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 34
193 Load_Cycle_Count 0x0032 077 077 000 Old_age Always - 369604
194 Temperature_Celsius 0x0022 120 107 000 Old_age Always - 32
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 29
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Disk 2 ,
=== START OF INFORMATION SECTION ===
Device Model: WDC WD20EARS-00J2GB0
Firmware Version: 80.00A80
User Capacity: 2,000,398,934,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Oct 27 09:48:35 2011 WEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (39600) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 171 167 021 Pre-fail Always - 8441
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 37
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 091 091 000 Old_age Always - 7209
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 35
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 34
193 Load_Cycle_Count 0x0032 080 080 000 Old_age Always - 362613
194 Temperature_Celsius 0x0022 117 106 000 Old_age Always - 35
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 12 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.355 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.197 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.041 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.884 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.726 SMART WRITE LOG
Error 11 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.197 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.041 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.884 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.726 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.568 SMART WRITE LOG
Error 10 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.041 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.884 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.726 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.568 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:27.388 IDENTIFY DEVICE
Error 9 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:27.884 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.726 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.568 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:27.388 IDENTIFY DEVICE
Error 8 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:27.726 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.568 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:27.388 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Disk 3
=== START OF INFORMATION SECTION ===
Device Model: WDC WD20EARS-00J2GB0
Firmware Version: 80.00A80
User Capacity: 2,000,398,934,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Oct 27 09:48:38 2011 WEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (40260) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 169 165 021 Pre-fail Always - 8550
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 37
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 091 091 000 Old_age Always - 7206
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 35
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 34
193 Load_Cycle_Count 0x0032 060 060 000 Old_age Always - 421549
194 Temperature_Celsius 0x0022 117 106 000 Old_age Always - 35
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 12 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.665 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.507 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.350 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.194 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.036 SMART WRITE LOG
Error 11 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.507 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.350 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.194 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.036 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.878 SMART WRITE LOG
Error 10 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.350 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.194 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.036 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.878 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:27.698 IDENTIFY DEVICE
Error 9 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.194 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:28.036 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.878 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:27.698 IDENTIFY DEVICE
Error 8 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:28.036 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:27.878 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:27.698 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Disk 4
=== START OF INFORMATION SECTION ===
Device Model: WDC WD20EARS-00J2GB0
Firmware Version: 80.00A80
User Capacity: 2,000,398,934,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Oct 27 09:48:43 2011 WEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (41880) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 168 164 021 Pre-fail Always - 8575
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 37
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 091 091 000 Old_age Always - 7170
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 35
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 34
193 Load_Cycle_Count 0x0032 059 059 000 Old_age Always - 423058
194 Temperature_Celsius 0x0022 120 109 000 Old_age Always - 32
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 12 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:30.259 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:30.101 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.944 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.787 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.630 SMART WRITE LOG
Error 11 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:30.101 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.944 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.787 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.630 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.472 SMART WRITE LOG
Error 10 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:29.944 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.787 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.630 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.472 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:29.291 IDENTIFY DEVICE
Error 9 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:29.787 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.630 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.472 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:29.291 IDENTIFY DEVICE
Error 8 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 40 00 12:30:29.630 SMART WRITE LOG
b0 d6 01 e0 4f c2 40 00 12:30:29.472 SMART WRITE LOG
ec 00 01 01 00 00 a0 00 12:30:29.291 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
What I find odd ( to my untrained eye ) is Disk 1 looks ok in the logs , no errors like 2,3,4 but yet that’s the one the failed .... also 2,3,4 are almost identical 12 errors ? hmmm? I have also read about ATA Error Counts , Reallocated Sector Counts and Load Cycle Count as ones to look out for as a guide to if you hard drive is on its way out ....
Is 12 ATA errors bad ? is a Load Cycle Count of disk 2: 362613 Disk 3: 421549 Disk 4: 423058 something I should be worrying about ? these hard drives are only 10 month old .
Any help / advice you can give me here would be most appreciated.
Alan
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