Duo V2: Resync after every start up

***** Disk SMART log from 2012/04/29 ***** ***** Disk SMART log for channel 1 [sda] ***** smartctl 5.40 2010-07-12 r3124 [armv5tel-unknown-linux-gnueabi] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HD204UI Serial Number: S2H7J9GB910334 Firmware Version: 1AQ10001 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Sun Apr 29 06:47:03 2012 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (20280) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 068 065 025 Pre-fail Always - 9952 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 227 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 629 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 27 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 357372 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 3 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 063 000 Old_age Always - 27 (Lifetime Min/Max 16/37) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 1 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 231 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 0 - Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. ***** Disk SMART log for channel 2 [sdb] ***** smartctl 5.40 2010-07-12 r3124 [armv5tel-unknown-linux-gnueabi] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HD204UI Serial Number: S2H7J9AB200936 Firmware Version: 1AQ10001 User Capacity: 2,000,398,934,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Sun Apr 29 06:47:09 2012 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (20520) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 255) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 19 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 067 067 025 Pre-fail Always - 10092 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1028 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2926 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 779 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 289614 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 21 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 064 000 Old_age Always - 27 (Lifetime Min/Max 11/60) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 96 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 7 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 1129 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.